ENGLISH

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

By Manoj Sachdev , José Pineda de Gyvez

Book information

Publisher
Springer
Year
2007
ISBN
9780387249933, 0387249931
ASIN
B0044KMB40
Open Library ID
OL22630476M
Language
english
Format
PDF
Filesize
6 MB (6121712 bytes)
Series
Frontiers in Electronic Testing Book 34
Edition
2
Pages
342\342
Library
mexmat
Time added
2009-07-20 03:45:11

Description

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

Similar books