ENGLISH

Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, ... Vision, Pattern Recognition, and Graphics)

By Marcello Pelillo (editor) , Andrea Torsello (editor) , Luca Rossi (editor) , Battista Biggio (editor) , Antonio Robles-Kelly (editor)

Book information

Publisher
Springer
Year
2021
ISBN
3030739724, 9783030739720
Language
english
Format
PDF
Filesize
53 MB (55641620 bytes)
Pages
392\384
Time added
2024-04-12 08:05:00

Description

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

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