Emerging Nanotechnologies -Test Defect Tolerance and Reliability -SP

Book information

Publisher

Kluwer

Year

2008

ISBN

978-0-387-24993-3, 978-0-387-25742-6, 978-0-387-29408-7, 978-0-387-30751-0

Open Library ID

OL7444741M

Language

english

Format

PDF

Filesize

9 MB (9241970 bytes)

Pages

411\411

Topic

Technique › Nanotechnology

Library

Kingdwarf

Time added

2010-01-07 06:59:20