ENGLISH

Transmission Electron Microscopy and Diffractometry of Materials

By Brent Fultz , James M. Howe

Book information

Publisher
Springer
Year
2007
ISBN
3540738851, 9783540738855
Open Library ID
OL12810609M
Language
english
Format
PDF
Filesize
13 MB (13644678 bytes)
Edition
3rd
Pages
771\771
Library
Kolxo3
Time added
2009-12-04 00:34:26

Description

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

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