Epioptics 2000: proceedings of the 19th course of the International School of Solid State Physics: Erice, Sicily, Italy, 19-25 July 2000

Description

This is the proceedings of a workshop which brought together researchers from universities and research institutes who work in the fields of (semiconductor) surface science, epitaxial growth, materials deposition and optical diagnostics relevant to (semiconductor) materials and structures of interest for present and anticipated (spin) electronic devices. The workshop assessed the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures, and examined the usefulness of these techniques for optimization of high quality multilayer samples through feedback control during materials growth and processing.  Read more... Optical properties of excitons in semiconductor quantum wells and microcavities, L.C. Andreani optical properties of semiconductor surfaces, G. Chiarotti et al measurements of second-order optical susceptibility in crystalline and porous silicon, M. Falasconi et al giant bilayer haemoglobin from earthworm studied by X-ray absorption spectroscopy and atomic force microscopy, M. Girasole et al SNOM and spectroscopy - a technique beyond the diffraction limit, V. Marocchi and A. Cricenti theory of second harmonic generation at semiconductor surfaces, B.S. Mendoza differential reflectivity and angle resolved photoemission of PbS(100), M. Tallarida et al deep-level defects at a lattice-mismatched InGaAs/GaAs interface, O. Yastrubchak et al and other papers.