ENGLISH

Thoughtful Machine Learning: A Test-Driven Approach

By Matthew Kirk

Book information

Publisher
O’Reilly Media
Year
2014
ISBN
978-1-44937-406-8
Language
english
Format
PDF
Filesize
6 MB (6657035 bytes)
Pages
235\235
Time added
2015-03-06 22:01:13

Description

Learn how to apply test-driven development (TDD) to machine-learning algorithms—and catch mistakes that could sink your analysis. In this practical guide, author Matthew Kirk takes you through the principles of TDD and machine learning, and shows you how to apply TDD to several machine-learning algorithms, including Naive Bayesian classifiers and Neural Networks. Machine-learning algorithms often have tests baked in, but they can't account for human errors in coding. Rather than blindly rely on machine-learning results as many researchers have, you can mitigate the risk of errors with TDD and write clean, stable machine-learning code. If you're familiar with Ruby 2.1, you're ready to start.

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