ENGLISH

EM material characterization techniques for metamaterials

Book information

Publisher
Springer
Year
2018
ISBN
978-981-10-6517-0, 9811065179, 978-981-10-6516-3
Language
english
Format
PDF
Filesize
2 MB (1692930 bytes)
Series
SpringerBriefs in electrical and computer engineering. Computational electromagnetics
Pages
\64
Time added
2017-10-15 16:00:00

Description

This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials Front Matter ....Pages i-xxiii Introduction (Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu)....Pages 1-2 Basics of Material Characterization (Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu)....Pages 3-4 EM Material Characterization Techniques (Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu)....Pages 5-41 Summary (Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu)....Pages 43-45 Back Matter ....Pages 47-50

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