ENGLISH

Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

By Paul van der Heide

Book information

Publisher
Wiley
Year
2014
ISBN
1118480481, 9781118480489
Language
english
Format
PDF
Filesize
4 MB (3856714 bytes)
Edition
1
Pages
384\386
Scanned
yes
Time added
2014-08-22 23:44:03
Химия и химическая промышленность;Аналитическая хи

Description

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)• Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations• Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission• Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)• Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions• Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

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