ENGLISH

Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014. Proceedings

By Francisco Escolano , Marcello Pelillo (eds.) , Marco Loog , Gavin Brown , Pasi Fränti

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2014
ISBN
978-3-662-44414-6, 978-3-662-44415-3
DOI
10.1007/978-3-662-44415-3
Language
english
Format
PDF
Filesize
15 MB (15383427 bytes)
Series
Lecture Notes in Computer Science 8621 Image Processing, Computer Vision, Pattern Recognition, and Graphics
Edition
1
Pages
478\493
Time added
2014-11-10 20:00:00
Artificial Intelligence (incl. Robotics); Pattern

Description

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.

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