ENGLISH

Nanoscale Spectroscopy and Its Applications to Semiconductor Research

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2002
ISBN
978-3-540-43312-5, 978-3-540-45850-0
DOI
10.1007/3-540-45850-6
Language
english
Format
PDF
Filesize
7 MB (7229661 bytes)
Series
Lecture Notes in Physics 588
Edition
1
Pages
308\311
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00

Description

Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- troscopy, spectroscopic photoelectron microscopy, and scan- ning probe spectroscopy. It will be useful as a compact source of reference for the experienced researcher, taking into account at the same time the needs of postgraduate stu- dents and nonspecialist researchers by using a tutorial ap- proach throughout. Fabrication technologies for nano-structured devices have been developed recently, and the electrical and optical properties of such nonostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, that is, Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher,taking at the same time into account the needs of post graduate students and nonspecialist researchers by using a tutorial approach throughout.

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