Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)

Description

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, Fourier Transfer Infrared Spectroscopy, Differential Scanning Calorimeter, Profilometer, and Thermogravimetric analysis. Features: Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. Cover Half Title Series Information Title Page Copyright Page Table of Contents Preface Acknowledgments About the Authors Introduction 1 Introduction to Material Characterization 1.1 Application of Advanced Characterization Technologies 1.1.1 Microscopy 1.1.2 Spectroscopy 1.2 Characterization Instruments 1.3 Advanced Materials and Characterization 1.4 Summary References 2 X-Ray Diffraction (XRD) 2.1 Construction of X-Ray Diffractometer 2.2 Working Principle 2.3 Diffraction Theory 2.4 Scattering Techniques 2.5 SIO2 Glass 2.6 Applications 2.7 Summary References 3 Nanomechanical System 3.1 Construction 3.2 Working Principle 3.3 Applications 3.4 Summary References 4 X-Ray Photo Spectroscopy (XPS) 4.1 Construction 4.2 Working Principle 4.3 Instrumentation 4.4 Application 4.4.1 Depth Profiling 4.5 Summary References 5 Scanning Electron Microscope (SEM) 5.1 Construction 5.2 Working Principle 5.3 Sample Preparation 5.4 Application 5.5 Summary References 6 Field Emission Scanning Electron Microscope (FESEM) 6.1 Construction 6.2 Working Principle 6.3 Sample Preparation 6.4 Application 6.5 Summary References 7 Transmission Electron Microscope (TEM) 7.1 Construction 7.2 Working Principle 7.3 Sample Preparation 7.4 Application 7.5 Summary References 8 Atomic Force Microscope (AFM) 8.1 Construction 8.2 AFM Working Principle 8.3 Application 8.4 Summary References 9 Near-Field Scanning Optical Microscope Raman 9.1 Construction 9.2 Working Principle 9.3 Application 9.4 Summary References 10 Optical Characterization Instruments 10.1 Construction 10.2 Working Principle 10.3 Application 10.4 Summary References 11 Synchrotron Techniques 11.1 Protein Crystallography 11.2 X-Ray Scattering 11.2.1 Scattering Techniques Based On X-Rays 11.3 X-Ray Absorption Spectroscopy (XAS) 11.4 Photoelectron Spectroscopy 11.5 Infrared Spectroscopy 11.5.1 Dispersive Spectrometers 11.5.2 Spectroscopic Design 11.5.3 Fourier Transform Spectrometers 11.5.4 Spectrometer Design 11.5.5 Advantages of FTIR 11.6 Circular Dichroism 11.6.1 Instrumentation 11.7 X-Ray Microprobe 11.8 Summary References 12 Other Advanced Instruments Used for Characterization of Functionally Graded Materials 12.1 Near-Edge X-Ray Absorption Fine Structure (NEXAFS) 12.2 Extended X-Ray Absorption Fine Structure 12.3 Summary References