ENGLISH

Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications

By Andrei Benediktovich , Ilya Feranchuk , Alexander Ulyanenkov (auth.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2014
ISBN
978-3-642-38176-8, 978-3-642-38177-5
DOI
10.1007/978-3-642-38177-5
Language
english
Format
PDF
Filesize
9 MB (9074096 bytes)
Series
Springer Series in Materials Science 183
Edition
1
Pages
318\325
Topic
Physics
Orientation
yes
Scanned
yes
Time added
2013-09-13 13:07:11
Mathematical and Computational Physics;Applied andMeasurement Science and Instrumentation;Characteri

Description

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

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