ENGLISH

Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scattering

By Dr. Helmut Dosch (eds.)

Book information

Publisher
Springer Berlin Heidelberg
Year
1992
ISBN
978-3-540-54534-7, 978-3-540-38456-4
DOI
10.1007/BFb0045209
Language
english
Format
PDF
Filesize
2 MB (2585987 bytes)
Series
Springer Tracts in Modern Physics 126
Pages
X, 149 p.\153
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Optical SpectroscopyThin Films; Characterization and Evaluation of MatUltrafast Optics; Physical Chemistry; Crystallogra

Description

This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.

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