ENGLISH

Thermal Conductivity Measurements in Atomically Thin Materials and Devices

By T. Serkan Kasirga

Book information

Publisher
Springer Singapore;Springer
Year
2020
ISBN
9789811553479, 9789811553486
DOI
10.1007/978-981-15-5348-6
Language
english
Format
PDF
Filesize
3 MB (2853169 bytes)
Series
SpringerBriefs in Applied Sciences and Technology
Edition
1st ed.
Pages
XV, 50\62
Time added
2021-01-06 05:41:07
Heat and Mass Transfer; Surface and Interface SciePhysics; Nanoscale Science and Technology; OpticalThin FilmsThin Films; Solid State Physics; Surfaces and Inte

Description

This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.

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