Nanocharacterization Techniques. A volume in Micro and Nano Technologies

Description

Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. Content: Front matter,Copyright,List of Contributors,Editor BiographiesEntitled to full text1 - Scanning Electron Microscopy, Pages 1-35, Marcelo de Assumpção Pereira-da-Silva, Fabio A. Ferri 2 - Atomic Force Microscopy: A Powerful Tool for Electrical Characterization, Pages 37-64, Ronald Tararam, Pâmela S. Garcia, Daiana K. Deda, José A. Varela, Fábio de Lima Leite 3 - Spectroscopic Techniques for Characterization of Nanomaterials, Pages 65-98, Priscila Alessio, Pedro H.B. Aoki, Leonardo N. Furini, Alvaro E. Aliaga, Carlos J. Leopoldo Constantino 4 - Dynamic Light Scattering Applied to Nanoparticle Characterization, Pages 99-110, Ana P. Ramos 5 - X-Ray Diffraction and Scattering by Nanomaterials, Pages 111-182, Diego G. Lamas, Mario de Oliveira Neto, Guinther Kellermann, Aldo F. Craievich 6 - Surface Plasmon Resonance (SPR) for Sensors and Biosensors, Pages 183-200, Celina M. Miyazaki, Flávio M. Shimizu, Marystela Ferreira Index, Pages 201-209