ENGLISH

Characterization of Microstructures by Analytical Electron Microscopy (AEM)

By Prof. Yonghua Rong (auth.)

Book information

Publisher
Springer Berlin Heidelberg
Year
2012
ISBN
978-3-642-20118-9, 978-3-642-20119-6
DOI
10.1007/978-3-642-20119-6
Language
english
Format
PDF
Filesize
16 MB (16759548 bytes)
Pages
\566
Time added
2014-02-12 18:00:00
Characterization and Evaluation of Materials; CondOptoelectronicsPlasmonics and Optical Devices

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