ENGLISH

Advanced Computing in Electron Microscopy

By Earl J. Kirkland (auth.)

Book information

Publisher
Springer US
Year
2010
ISBN
1441965327, 9781441965325, 9781441965332
DOI
10.1007/978-1-4419-6533-2
Language
english
Format
PDF
Filesize
5 MB (5124557 bytes)
Edition
2
Pages
289\300
Topic
Physics
Time added
2012-03-17 06:00:00
Characterization and Evaluation of Materials; Elec

Description

Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity

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