Silicon Analog Components: Device Design, Process Integration, Characterization, and Reliability

Description

This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors’ extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science. Enables engineers to understand analog device physics, and discusses important relations between process integration, device design, component characteristics, and reliability; Describes in step-by-step fashion the components that are used in analog designs, the particular characteristics of analog components, while comparing them to digital applications; Explains the second-order effects in analog devices, and trade-offs between these effects when designing components and developing an integrated process for their manufacturing. Front Matter ....Pages i-xlix The World Is Analog (Badih El-Kareh, Lou N. Hutter)....Pages 1-24 Review of Single-Crystal Silicon Properties (Badih El-Kareh, Lou N. Hutter)....Pages 25-63 PN Junctions (Badih El-Kareh, Lou N. Hutter)....Pages 65-111 Rectifying and Ohmic Contacts (Badih El-Kareh, Lou N. Hutter)....Pages 113-149 Bipolar and Junction Field-Effect Transistors (Badih El-Kareh, Lou N. Hutter)....Pages 151-219 Analog/RF CMOS (Badih El-Kareh, Lou N. Hutter)....Pages 221-306 High-Voltage and Power Transistors (Badih El-Kareh, Lou N. Hutter)....Pages 307-388 Passive Components (Badih El-Kareh, Lou N. Hutter)....Pages 389-446 Process Integration (Badih El-Kareh, Lou N. Hutter)....Pages 447-494 Mismatch and Noise (Badih El-Kareh, Lou N. Hutter)....Pages 495-538 Chip Reliability (Badih El-Kareh, Lou N. Hutter)....Pages 539-619 Back Matter ....Pages 621-648