ENGLISH

Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

Book information

Publisher
Springer
Year
2005
ISBN
3540253033, 9783540253037
Language
english
Format
PDF
Filesize
7 MB (7775372 bytes)
Series
Springer Series in Materials Science
Edition
1st
Pages
512\512
Time added
2011-04-20 14:05:05

Description

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.

Similar books