Test Generation of Crosstalk Delay Faults in VLSI Circuits

Description

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing. Front Matter ....Pages i-xi Introduction (S. Jayanthy, M. C. Bhuvaneswari)....Pages 1-14 Delay Fault Testing of VLSI Circuits (S. Jayanthy, M. C. Bhuvaneswari)....Pages 15-35 Test Generation Algorithms for Crosstalk Faults (S. Jayanthy, M. C. Bhuvaneswari)....Pages 37-55 An Automatic Test Generation Method for Crosstalk Delay Faults Using Modified FAN Algorithm (S. Jayanthy, M. C. Bhuvaneswari)....Pages 57-77 ATPG for Crosstalk Delay Faults using Single-Objective Genetic Algorithm (S. Jayanthy, M. C. Bhuvaneswari)....Pages 79-97 ATPG for Crosstalk Delay Faults Using Particle Swarm Optimization Algorithm (S. Jayanthy, M. C. Bhuvaneswari)....Pages 99-108 ATPG for Crosstalk Delay Faults Using Multi-objective Genetic Algorithm (S. Jayanthy, M. C. Bhuvaneswari)....Pages 109-123 Simulation of Asynchronous Sequential Circuits Using Fuzzy Delay Model for Crosstalk Delay Faults (S. Jayanthy, M. C. Bhuvaneswari)....Pages 125-139 Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits (S. Jayanthy, M. C. Bhuvaneswari)....Pages 141-150 Summary and Suggestions for Future Research (S. Jayanthy, M. C. Bhuvaneswari)....Pages 151-156