ENGLISH

Laboratory Micro-X-Ray Fluorescence Spectroscopy: Instrumentation and Applications

By Michael Haschke (auth.)

Book information

Publisher
Springer International Publishing
Year
2014
ISBN
978-3-319-04863-5, 978-3-319-04864-2
DOI
10.1007/978-3-319-04864-2
Language
english
Format
PDF
Filesize
12 MB (13048328 bytes)
Series
Springer Series in Surface Sciences 55
Edition
1
Pages
356\367
Topic
Physics
Time added
2014-06-12 06:00:00
Spectroscopy and Microscopy; Surfaces and InterfacThin FilmsThin Films; Measurement Science and Instrumentatio

Description

Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.

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