ENGLISH

Introduction to Scanning Tunneling Microscopy

By C. Julian Chen

Book information

Publisher
Oxford University Press, USA
Year
1993
ISBN
0195071506, 9780195071504, 9781423764618
LCC
QH212.S35 C44 1993
Open Library ID
OL1735121M
Language
english
Format
PDF
Filesize
15 MB (16152901 bytes)
Series
Oxford Series in Optical & Imaging Sciences
Pages
472\469
Topic
Chemistry
Time added
2011-04-11 19:55:47

Description

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

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