Characterization Techniques for Nanomaterials

Description

Manipulation of matter at the nanoscale level is the key factor in nanotechnology, and it is considered as a great driving force behind the current industrial revolution since it offers facile and feasible remedies for many problems. Because of the unique characteristic properties of nanomaterials, they can be employed in a wide variety of fields such as agriculture and food technology, catalysis, biomedical applications, tissue culture engineering, and fertilizers. In this regard, characterization of nanomaterials plays a significant role in determining their optical, thermal, and physicochemical properties. Many techniques have been used in nanomaterial characterization, and the most important techniques are discussed in detail in this book with their principles, basic operation procedures, and applications with suitable examples. In summary, this book offers broad content on the most important chemical and structural characterization techniques of nanomaterials. The book offers comprehensive coverage of the most essential topics, including the following • Provides a comprehensive understanding of physical and chemical characterization techniques of nanomaterials • Includes details about basic principles of each characterization technique with appropriate examples • Covers most of the important characterization techniques that should be known to undergraduate/early career scientists/beginners in materials chemistry • Provides all the basic knowledge to understand and carry out the respective analysis of nanomaterials • Fulfills the timely need of a book that covers the most important and useful characterization techniques in nanomaterial characterization Up to date, there are no other books/book chapters which discuss most of these nanocharacterization techniques in one segment with all the basic instrumentation details and narrated examples of nanomaterial characterization. In a nutshell, this book will be a great asset to undergraduates/early career scientists/beginners of material science as it provides a comprehensive and complete understanding of most of the techniques used in nanocharacterization tools in a short time. Intended audience is based on science education while specifically focusing on undergraduates/graduate students/early scientists and beginners of chemistry, materials chemistry, and nanotechnology and nanoscience. Cover Half Title Title Page Copyright Page Table of Contents Preface Authors 1 Introduction to Nanomaterial Characterization References 2 Chemical and Structural Characterization of Nanomaterials 2.1 Particle Morphology and Size 2.2 Local Structure 2.3 Crystal Structure 2.4 Microstructure References 3 Parameters of Nanomaterials which Should be Characterized 3.1 Morphological Features 3.2 Structural Defects 3.3 Optical Studies 3.4 Structural Analysis 3.5 Elemental Studies 3.6 Size Estimation 3.7 Physicochemical Characteristics 3.8 Magnetic Properties References 4 Chemical Characterization Techniques in Detail 4.1 Optical Spectroscopy 4.1.1 Optical Absorption Spectroscopy (OAS) 4.1.2 Photoluminescence (PL) 4.1.3 Fourier Transform Infrared Spectroscopy (FTIR) 4.1.4 Raman Spectroscopy 4.2 Electron Spectroscopy 4.2.1 Energy Dispersive X-Ray Spectroscopy (EDS) 4.2.2 X-Ray Photoelectron Spectroscopy (XPS) 4.2.3 Auger Electron Spectroscopy (AES) 4.2.4 Ultraviolet Photoelectron Spectroscopy (UPS) 4.3 Ionic Scattering Spectroscopy 4.3.1 Ion Scattering Spectroscopy 4.3.2 Basic Ions in Ion Scattering Spectroscopy 4.3.3 Mass Resolution by Ion Scattering Spectroscopy 4.4 Rutherford Backscattering Spectrometry (RBS) 4.5 Secondary Ion Mass Spectrometry (SIMS) References 5 Structural Characterization Techniques in Detail 5.1 X-Ray Diffraction Technique (XRD) 5.1.1 Small-Angle X-Ray Scattering (SAXS) 5.2 Electron Microscopy 5.2.1 Scanning Electron Microscopy (SEM) 5.2.2 Transmission Electron Microscopy (TEM)/High Resolution (HR-TEM) with Selected Area Electron Diffraction (SAED) 5.2.3 Environmental Transmission Electron Microscopy (ETEM) 5.2.4 Scanning Probe Microscopy (SPM) 5.3 Dynamic Light Scattering 5.4 X-Ray Absorption Spectroscopy (XAS) 5.5 The Brunauer-Emmett-Teller (BET) 5.6 Thermal Gravimetric Analysis (TGA) 5.7 Superconducting Quantum Interference Device Magnetometry (SQUID) References Index