ENGLISH

Scanning Microscopy for Nanotechnology: Techniques and Applications

By Zhong Lin Wang , Weilie Zhou

Book information

Publisher
Springer
Year
2006
ISBN
9780387333250, 0387333258
Open Library ID
OL17210574M
Language
english
Format
PDF
Filesize
112 MB (117342320 bytes)
Edition
1
Pages
534\534
Time added
2010-04-25 21:59:20

Description

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.

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