ENGLISH

Reliability and Radiation Effects in Compound Semiconductors

By Allan , Johnston

Book information

Publisher
World Scientific
Year
2010
ISBN
978-1-61583-687-1, 978-981-4277-10-5
Language
english
Format
PDF
Filesize
4 MB (4114008 bytes)
Pages
375\378
Orientation
yes
Scanned
landscape
Time added
2013-08-14 18:00:00

Description

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. First, it starts with principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for 10 years or more with low failure rates.

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