ENGLISH

Multi-Chip Module Test Strategies

By Yervant Zorian , V. D. Agrawal (auth.) , Yervant Zorian (eds.)

Book information

Publisher
Springer US
Year
1997
ISBN
978-1-4613-7798-6, 978-1-4615-6107-1
DOI
10.1007/978-1-4615-6107-1
Language
english
Format
PDF
Filesize
9 MB (9923426 bytes)
Series
Frontiers in Electronic Testing 7
Edition
1
Pages
167\160
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Circuits and Systems; Electrical Engineering

Description

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

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