ENGLISH

Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons

By Mathias Schubert (auth.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2005
ISBN
978-3-540-23249-0, 978-3-540-44701-6
DOI
10.1007/b11964
Language
english
Format
PDF
Filesize
10 MB (10877414 bytes)
Series
Springer Tracts in Modern Physics 209
Edition
1
Pages
196\181
Time added
2014-11-24 04:00:00
Optical Devices; Physics and Applied Physics in EnOptoelectronicsSurfaces and InterfacesThin Films; Optical and Electronic Materials; Appl

Description

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

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