ENGLISH

Control Problems in Industry: Proceedings from the SIAM Symposium on Control Problems San Diego, California July 22–23, 1994

Book information

Publisher
Birkhäuser Basel
Year
1995
ISBN
978-1-4612-7589-3, 978-1-4612-2580-5
DOI
10.1007/978-1-4612-2580-5
Language
english
Format
PDF
Filesize
25 MB (25980771 bytes)
Edition
1
Pages
353\360
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00

Description

This volume contains a collection of papers presented at the Symposium on Control Problems in Industry, held on July 22-23, 1994 in San Diego. The Symposium, conducted by the Society for Industrial and Applied Math­ ematics (SIAM), with the cooperation of the Institut National Recherche Informatique et Automatique (INRIA) , focused on industrial control ap­ plications that have benefited from recent mathematical and technological developments. A partial list of themes featured by the Symposium is listed below. 1) Applications of Control Techniques in a) the aerospace industry, b) the automotive industry, c) the environmental science, d) manufacturing processes, e) the petroleum industry. 2) Optimal Shape Design in Aerospace Applications 3) Optimal Design of Micro-optics 4) Robust Control and H-infinity Methods The purpose of this meeting was to bring together experts from in­ dustry and academia to share their experience and present new results and new trends in modern control theory, with a focus on real industrial applications. The presentations were selected primarily for the practical significance of the problem solved, though all had significant mathemati­ cal components. Control theory is an interdisciplinary field which, in its broadest sense, encompasses contributions ranging from classical engineer­ ing disciplines (circuit theory, automata theory, electronics, manufacturing, mechanical engineering, material science), to theoretical engineering (sys­ tem theory, computer science) and various areas of mathematics such as ODE, PDE, complex analysis, function theory, algebraic and differential geometry, numerical analysis, etc.

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