ENGLISH

Atomic Force Microscopy Scanning Tunneling Microscopy

Book information

Publisher
Springer
Year
1999
ISBN
9780306462979, 0-306-46297-4
LCC
QH212.A78 A864 1999
Open Library ID
OL49287M
Language
english
Format
PDF
Filesize
5 MB (4884605 bytes)
Edition
1
Pages
219\219
Library
Techlib
Time added
2009-11-09 02:42:13

Description

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

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