ENGLISH

Ellipsometry of Functional Organic Surfaces and Films

By Christoph Cobet (auth.) , Karsten Hinrichs , Klaus-Jochen Eichhorn (eds.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2014
ISBN
978-3-642-40127-5, 978-3-642-40128-2
DOI
10.1007/978-3-642-40128-2
Language
english
Format
PDF
Filesize
13 MB (13433856 bytes)
Series
Springer Series in Surface Sciences 52
Edition
1
Pages
363\369
Orientation
yes
Scanned
yes
Time added
2013-11-01 16:56:07
OptoelectronicsPlasmonics and Optical Devices;Characterization anSurface and Interface ScienceThin Films;Physical Chemistry;OpticsThin Films;Surfaces and Interfaces

Description

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

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