ENGLISH

Atomic and Nuclear Analytical Methods: XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques

By Dr. H. R. Verma (auth.)

Book information

Publisher
Springer-Verlag Berlin Heidelberg
Year
2007
ISBN
978-3-540-30277-3, 978-3-540-30279-7
DOI
10.1007/978-3-540-30279-7
Language
english
Format
PDF
Filesize
8 MB (8454240 bytes)
Edition
1
Pages
376\381
Orientation
yes
Scanned
yes
Time added
2013-08-01 04:00:00
Clusters and Plasmas;Condensed Matter;ElectromagneInstrumentation;Analytical Chemistry;CharacterizatMeasurement ScienceMoleculesOptics and Lasers

Description

This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), Mössbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray Emission Analysis (PIXE), Rutherford Backscattering Analysis (RBS), Elastic Recoil Detection (ERD), Nuclear Reaction Analysis (NRA), Particle Induced Gamma-ray Emission Analysis (PIGE), and Accelerator Mass Spectrometry (AMS). These techniques are commonly applied in the fields of medicine, biology, environmental studies, archaeology or geology et al. and pursued in major international research laboratories.

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