ENGLISH

Atom-Probe Tomography: The Local Electrode Atom Probe

By Michael K. Miller , Richard G. Forbes (auth.)

Book information

Publisher
Springer US
Year
2014
ISBN
978-1-4899-7429-7, 978-1-4899-7430-3
DOI
10.1007/978-1-4899-7430-3
Language
english
Format
PDF
Filesize
13 MB (13886782 bytes)
Edition
1
Pages
423\437
Time added
2014-11-10 20:00:00
Characterization and Evaluation of Materials; Soli

Description

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.

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