Ultra Low Noise CMOS Image Sensors

Description

This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors. Front Matter ....Pages i-xiv Introduction (Assim Boukhayma)....Pages 1-11 Low-Noise CMOS Image Sensors (Assim Boukhayma)....Pages 13-34 Noise Sources and Mechanisms in CIS (Assim Boukhayma)....Pages 35-60 Detailed Noise Analysis in Low-Noise CMOS Image Sensors (Assim Boukhayma)....Pages 61-83 Noise Reduction in CIS Readout Chains (Assim Boukhayma)....Pages 85-99 Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process (Assim Boukhayma)....Pages 101-110 Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process (Assim Boukhayma)....Pages 111-128 A Passive Switched-Capacitor Circuit for Correlated Multiple Sampling (Assim Boukhayma)....Pages 129-136 Downscaling Effects Towards Photon Counting Capability in CIS (Assim Boukhayma)....Pages 137-143 An Ultra Low Noise CMOS THz Imager (Assim Boukhayma)....Pages 145-166 Conclusion (Assim Boukhayma)....Pages 167-173 Back Matter ....Pages 175-180