ENGLISH

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

By Alvin W. Czanderna , Theodore E. Madey , Cedric J. Powell

Book information

Publisher
Springer
Year
1998
ISBN
0306469146, 0306458969, 9780306458965
ASIN
B000OSFKXA
LCC
TA418.7 .B43 1998
Open Library ID
OL379139M
Language
english
Format
PDF
Filesize
8 MB (8237580 bytes)
Series
Methods of Surface Characterization
Edition
1
Pages
450\451
Library
kolxoz Chemistry
Time added
2009-07-20 19:17:56

Description

Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. This introductory text describes the principles, techniques, and methods vital for efficient surface analysis. A wealth of practical information is assembled in this single volume, including summary tables, extensive references, and 251 illustrative figures.

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